Mon premier blog

Digital Systems Testing & Testable Design by Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman

Digital Systems Testing & Testable Design Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman ebook
Format: pdf
ISBN: 0780310624, 9780780310629
Page: 653
Publisher:

A730;Digital Systems Testing and Testable Design;;Miron Abramovici, Melvin A.B., Arthur D.F;;1993; 130.000 ; 97.500. Digital Systems Testing & Testable Design. Friedman- John Wiley & Sons Inc. Fundamentals of Logic Design – Charles H. Roth, 5th ed., Cengage Learning. This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. The topics discussed are: Importance of VLSI Testing, Test process and Automatic Test Equipment, Defects versus Fault models, Fault simulation, Logic simulation, Combinational Circuit Testing, Sequential Circuit Testing, Memory Testing, Design-for-Testability, Scan Design, Boundary Scan, Built-in-Self Test, Delay Test, Current Testing, VLSI Reliability, etc. Digital Systems Testing & Testable Design by Miron Abramovici, Melvin A. Digital Systems Testing and Testable Design – Miron Abramovici, Melvin A. Hill & Peterson; Digital System Testing and Testable Design by M. Friedman; Digital Logic Design Principles by Nolman Balabanian, Bradley Calson; Fundamentals of Logic Design by Charles H. This course is an introduction to the field of digital systems testing, which is an integral part of IC design and manufacturing. Digital System Test and Testable Design: Using HDL Models and Architectures by: Zainalabedin Navabi This book is about digital system test and testable design.